In 8052 to achieve voltage-level test capabilities, develop their own single-chip system

voltage_frequency_testing_finally
.................................\delay.c
.................................\delay.c.bak
.................................\display.c
.................................\format.c
.................................\get0809.c
.................................\get_digit.c
.................................\head.h
.................................\init.c
.................................\keyscan.c
.................................\key_pro.c
.................................\main.c
.................................\main.LST
.................................\main.OBJ
.................................\port.h
.................................\put9851.c
.................................\put_digit.c
.................................\vf_test_proj
.................................\vf_test_proj.hex
.................................\vf_test_proj.lnp
.................................\vf_test_proj.M51
.................................\vf_test_proj.Opt
.................................\vf_test_proj.plg
.................................\vf_test_proj.Uv2
.................................\vf_test_proj_Opt.Bak
.................................\vf_test_proj_Uv2.Bak

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