Introduction - If you have any usage issues, please Google them yourself
In recent years, the field emission phenomenon caused by the use of cutting-edge effects, to achieve a series of new progress in science and technology such as the use of field emission tip into the resolution of " Aye" level the field ion microscope (FIM) and scanning tunneling microscopy (ST M), microscopy innovations Another example is the use of thin-film field emission cathode successful development of vacuum microelectronic devices, integration, operation speed, power consumption and reliability are much better than solid