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VLSI-test-technology

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  • Update : 2008-10-13
  • Size : 3.39mb
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  • Author :杨***
  • About : 杨涛
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Calculated by the Chinese Academy of Sciences researcher Li Xiaowei of VLSI testing and design for testability notes
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Packet : 43680518vlsi-test-technology.rar filelist
第4讲2007-10-15.ppt
第5讲2007-10-22.ppt
第6讲2007-10-29.ppt
第7讲2007-11-05.ppt
预讲20070910.ppt
program.pdf
第1讲20070910.ppt
第2讲20070917.ppt
第3讲20070924.ppt
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