Introduction - If you have any usage issues, please Google them yourself
SIFT was developed by David Lowe, a professor at UBC (University of British Column) in 1999, and developed a key point (or interest points) of the image in 2004, and A sketch of the local scale invariant feature is extracted the key point, and the descriptor is used to perform matching on the two related images. At present, SIFT can be described as one of the hottest features of all local image features.