随着深亚微米技术不断的发展，在SoC 设计中存储器需求越来越大，芯片的量产需要有效率而又 具有相对的低成本的测试方法。可编程存储器内建自测试方法基于客制化的控制器，提供了一定程度可 靠的弹性以及所需合理的硬件成本。我们在本文提出了一个P-M

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一种节约面积的可编程存储器内建自测试设计方法.pdf

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