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Description: 局部放电试验所采集的信号中往往混有白噪声、周期干扰信号去除。此处采用常用db系列小波中的db6小波进行9尺度的多分辨分解后，根据白噪声能量特性，估算各尺度的阈值大小，采用硬值进行处理，后进行重构。-Partial discharge test of the signal collected is often mixed with white noise, periodic interference signal removal. Here the use of commonly used wavelet db Series DB6 wavelet carried out in the 9-scale multiresolution decomposition, based on the energy characteristics of white noise to estimate the scale threshold size, the use of hard-value deal, after the remodeling.
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Size: 33792 |
Author: rex |
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Description: January 1988
MM54HC00/MM74HC00
Quad 2-Input NAND Gate
General Description
These NAND gates utilize advanced silicon-gate CMOS
technology to achieve operating speeds similar to LS-TTL
gates with the low power consumption of standard CMOS
integrated circuits. All gates have buffered outputs. All de-
vices have high noise immunity and the ability to drive 10
LS-TTL loads. The 54HC/74HC logic family is functionally
as well as pin-out compatible with the standard 54LS/74LS
logic family. All inputs are protected from damage due to
static discharge by internal diode clamps to VCC and
ground.
Features
Y Typical propagation delay: 8 ns
Y Wide power supply range: 2–6V
Y Low quiescent current: 20 mA maximum (74HC Series)
Y Low input current: 1 mA maximum
Y Fanout of 10 LS-TTL loads-January 1988MM54HC00/MM74HC00Quad 2-Input NAND GateGeneral DescriptionThese NAND gates utilize advanced silicon-gate CMOStechnology to achieve operating speeds similar to LS-TTLgates with the low power consumption of standard CMOSintegrated circuits. All gates have buffered outputs. All de-vices have high noise immunity and the ability to drive 10LS-TTL loads. The 54HC/74HC logic family is functionallyas well as pin-out compatible with the standard 54LS/74LSlogic family. All inputs are protected from damage due tostatic discharge by internal diode clamps to VCC andground. FeaturesY Typical propagation delay: 8 nsY Wide power supply range: 2-6VY Low quiescent current: 20 mA maximum (74HC Series) Y Low input current: 1 mA maximumY Fanout of 10 LS-TTL loads
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Size: 11897856 |
Author: 123wj |
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Description: 电子系统中噪声的抑制与衰减技术：第二版 目录
1，绪论
2，电缆布线
3，接地
4，电路平衡与滤波
5，无源器件
6，屏蔽
7，触点保护
8，本征噪声源
9，有源器件的噪声
10，数字电路的噪声与布局
11，数字电路的辐射
12，静电放电-Electronic systems and attenuation of noise suppression techniques: second edition of the directory 1, Introduction 2, cable wiring 3, grounding 4, circuit balance and filter 5, 6, passive components, shielding 7, 8 contact protection, intrinsic noise sources 9, the active device noise 10, digital circuit noise and layout of 11, the digital circuits 12 of radiation, electrostatic discharge
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Size: 4056064 |
Author: 王一民 |
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Description: 局部放电指数衰减信号产生程序，加噪声程序以及除噪声程序-Exponential decay of partial discharge signal generation program, plus noise process and procedures, inter-noise
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Size: 2048 |
Author: 沈健 |
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Description: 基于小波变换的局部放电信号消噪技术研究，包括程序和参考文献。-Noise cancellation technology research partial discharge signal based on wavelet transform, including the program and reference papers.
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Size: 13464576 |
Author: 纪东良 |
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Description: 小波分析、局部放电试验所采集的信号中往往混有白噪声、周期干扰信号去除。此处采用常用db系列小波中的db6小波进行9尺度的多分辨分解后，根据白噪声能量特性，估算各尺度的阈值大小，采用硬值进行处理，后进行重构。-Wavelet Analysis、Signal acquired partial discharge test is often mixed with white noise, periodic interference signal removal. Db series wavelet commonly used here in db6 9 scale wavelet multi-resolution decomposition, according to the energy characteristics of white noise, the estimated size of each scale thresholds, hard-value processing, after reconstruction.
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Size: 33792 |
Author: 小贺 |
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Description: 小波包法去除放电信号中的白噪声，采用db4小波分解4层-Removal of wavelet packet discharge signal white noise, using four-layer wavelet decomposition db4
Platform: |
Size: 1024 |
Author: 周喜梅 |
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