Search - sd test

[SCM] SDTest

Description: WinCE环境下检测SD卡序列号，编程环境： eVC4.0 + PPC2003。文件清单： newres.h ReadMe.txt Resource.h SDTest.aps SDTest.cpp SDTest.h SDTest.rc SDTest.vcc SDTest.vcl SDTest.vcp SDTestDlg.cpp SDTestDlg.h StdAfx.cpp StdAfx.h-WinCE environment Sequence Detection SD card, programming environment : eVC4.0 PPC2003. The list of documents : newres.h ReadMe.txt file Resource.h SDTest.aps SD Test.cpp SDTest.h SDTest.rc SDTest.vcc SDTes t.vcl SDTest.vcp SDTestDlg.cpp SDTestDlg.h S tdAfx.cpp StdAfx.h
Platform: | Size: 135168 | Author: water1974 | Hits:

[SCM] sd

Description: SPI接口SD卡调试程序本人做MP3用的通过测试-SPI interface SD card MP3 debugger I used to do to pass the test
Platform: | Size: 1024 | Author: cobra | Hits:

[Other Embeded program] sdiocontrollerbase

Description: 2440 SD卡驱动源码第二部分继续上传-2440 SD card driver source to continue to upload the second part of
Platform: | Size: 16384 | Author: fusq | Hits:

[Linux-Unix] 69491704s3c2410-full-test-code

Description: linux SD 程序 -procedure linux SD
Platform: | Size: 657408 | Author: jerrylee | Hits:

[ARM-PowerPC-ColdFire-MIPS] SDCard_test

Description: SD卡的SPI驱动程序，已在Nios2 IDE 中调试成功-SD card SPI driver, has been successful Nios2 IDE in debug
Platform: | Size: 24576 | Author: jzt | Hits:

[ARM-PowerPC-ColdFire-MIPS] SD

Description: 东南大学开发ARM7芯片SD卡测试程序，完全可用-Southeast University to develop ARM7 chip SD card test procedure, fully available
Platform: | Size: 51200 | Author: liwei | Hits:

[ARM-PowerPC-ColdFire-MIPS] MMC-sd

Description: ＡＲＭ９　ＡＴ９２００　，SDMMC原码，测试通，运行稳定，适合学习和开发参考。-ARM9 AT9200, SDMMC the original code, the test pass, running stability, suitable for learning and development of reference.
Platform: | Size: 327680 | Author: keny | Hits:

[Internet-Network] s3c2410-sd

Description: 这是S3C2410的SD卡测试程序，此程序经过测试是OK的-This is the SD card S3C2410 test procedure, this procedure has been tested OK are the
Platform: | Size: 8192 | Author: 何少华 | Hits:

[Other] WR_test

Description: read and write to test the SD flash memory
Platform: | Size: 87040 | Author: Asher | Hits:

[ARM-PowerPC-ColdFire-MIPS] LJD2440_Test

Description: 三星2440测试程序，包括LCD，触摸屏，串口，USB，PWM，ADC，红外，CAN，SD卡等-Code of S3c2440 test, include LCD LTV350QV-F05,UART,USB,PWM,ADC,IrDA,CAN,SD.
Platform: | Size: 3710976 | Author: 海鸥 | Hits:

[SCM] SD-test

Description: SD卡读写，可将SD卡的内容读出，并写入相应的内容-SD card reader, SD card content can be read, and write the contents of the corresponding
Platform: | Size: 37888 | Author: ljq | Hits:

[Embeded-SCM Develop] at91sam7x-sd-spi-keil

Description: atmel at91sam7x256 sd卡测试源码 keil源码-atmel at91sam7x256 sd card test source keil source
Platform: | Size: 224256 | Author: zhujiu | Hits:

[Driver Develop] sd-test

Description: ARM SD卡测试程序，可以用于编写ARM的SD接口驱动-ARM SD card test program, can be used for the preparation of the SD interface driver ARM
Platform: | Size: 5120 | Author: yang | Hits:

[SCM] sd-test

Description: SD 卡的驱动代码，不过要注意SD卡和单片机之间的信号电平转换。-SD card test
Platform: | Size: 51200 | Author: 金金 | Hits:

[SCM] sd-test-4G

Description: 4G大容量SD卡的驱动，和2G以下的SD卡不同。-SD card drive code
Platform: | Size: 67584 | Author: 金金 | Hits:

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