Description: Through the image processing to silicon chips, and to realize the dependence of ceramics edge silicon wafer recognition and then the number of statistics, to get the information crystallinity silicon chips. To overcome the previous in solar cell manufacturing process judgment standard not unity, artificial leak wait for the happening of the circumstance, can be achieved by machine to replace artificial each piece of substrate detection.
The research results of the project can be used not only in the silicon substrate detection, in the other low contrast images, including edge extraction and area of statistics, and other aspects of the handle, all can use. It shows the research results have very strong practicability and a very wide application range, has the very high use value.
To Search:
File list (Check if you may need any files):
edge eaxm.txt
Download