Description: A major obstacle that stands in the way of efficient test
response compaction are the unknown values (x-values) captured
by scan cells during testing. If test responses with
x-values are compacted, some of the outputs of the compactor
may also take unknown values and the correctness of the
compactor inputs cannot be verified at the
limited compaction rates
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source\Command.vhd
......\control_interface.vhd
......\pll1.vhd
......\sdr_data_path.vhd
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