External single-chip digital control a total of Yang countdown circuit for testing were positive realization of the digital control circuit simulation, and function of the realization of single-chip IO port detection.

共阳数码管测试
..............\Last Loaded NUETES.DBK
..............\NUETES.ASM
..............\NUETES.DSN
..............\NUETES.hex
..............\NUETES.lst
..............\NUETES.PWI
..............\NUETES.SDI

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