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Description: There are many different (and often confusing) terms associated
with clock-based devices. This application note attempts
to clarify these terms, and hence serves as a comprehensive
reference on clock terminology. This application note can be
divided into two sections. The first section describes and distinguishes
between various clock sources available today.
The second section defines and distinguishes between various
parameters used to describe clocks. This section also provides methods of measuring some of these parameters.
To Search:
- [CaptureScreen] - The screenshot program implemented with
- [edm3jitrpll] - Jitter is extremely important in systems
- [edm3layout] - Cypress Semiconductor makes a variety of
- [Jitter] - Jitter introduced the basis of measureme
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