Description: We present a new test data compression and decompression architecture based on a novel and
efficient code , named PTIDR code1 The proposed approach can acquire better compression efficiency than
that of FDR (f requency2directed run2length) , EFDR (extended FDR) , alternating FDR etc1 The decoder
of PTIDR is also simpler , easier to realize and needs less hardware consumption1 Compared with algorithms
such as selective Huffman and CDCR (combining dictionary coding and L FSR reseeding) , PTIDR can ac2
quire higher CRPAR (ratio of compression ratio and area ratio) 1 Especially , when the probability of 0s in the
difference test set is greater than or equal to 017610 , it can acquire better compression efficiency than FDR
code , and thus , reducing the test cost of the chip1
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基于PTIDR编码的测试数据压缩算法.pdf
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