Description: Testability is the concern most often voiced by Texas Instruments (TIä )
application specific integrated circuit (ASIC) users. This document is intended
to consolidate TI policies into a coherent approach to designing for testability.
It is not intended as a specification, but as a guide you can use for developing
test strategies when designs are being initiated
To Search:
- [NANDFAT] - the NANDFLASH introduced the principle o
- [tz] - DELPHI using automatically generated cod
- [tm] - DELPHI using API automatically concise f
- [ITProjectManage] - From programmer to project manager to pa
File list (Check if you may need any files):
design_for_test.pdf
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