Description: a realization of Time-zero dilectric breakdown according to Jedec standard,which can use to achieve reliability of wafer
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File list (Check if you may need any files):
Reliablity_ramp_thin_oxide\Reliabilitylib\help\header.h
..........................\..............\....\header.hlp
..........................\..............\....\Reliabilitylib_visibility
..........................\..............\....\vramp_thinOxide.hlp
..........................\..............\....\vramp_thinOxide_proto.h
..........................\..............\kitt_obj\dllmain.obj
..........................\..............\........\Reliabilitylib.lrf
..........................\..............\........\Reliabilitylib_modules.mak
..........................\..............\........\w_vramp_thinOxide.obj
..........................\..............\.....src\dllmain.c
..........................\..............\........\w_vramp_thinOxide.c
..........................\..............\obj\vc60.idb
..........................\..............\...\vc60.pdb
..........................\..............\...\vc70.idb
..........................\..............\...\vc70.pdb
..........................\..............\...\vramp_thinOxide.obj
..........................\..............\Reliabilitylib.def
..........................\..............\src\vramp_thinOxide.c
..........................\Reliabilitylib.dll
..........................\Reliabilitylib.exp
..........................\Reliabilitylib.lib
..........................\Reliabilitylib_proto.h
..........................\..............\bak
..........................\..............\help
..........................\..............\kitt_obj
..........................\..............\kitt_src
..........................\..............\lock
..........................\..............\obj
..........................\..............\src
..........................\Reliabilitylib
Reliablity_ramp_thin_oxide
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