Description: In recent years, the field emission phenomenon caused by the use of cutting-edge effects, to achieve a series of new progress in science and technology such as the use of field emission tip into the resolution of " Aye" level the field ion microscope (FIM) and scanning tunneling microscopy (ST M), microscopy innovations Another example is the use of thin-film field emission cathode successful development of vacuum microelectronic devices, integration, operation speed, power consumption and reliability are much better than solid
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尖端效应及其数学表达式.pdf
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