Description: Local Binary Patterns, LBP, is one of the features which has been used for texture
classification. In this paper, a method based on using these features is proposed for
detecting defects in patterned fabrics. In the training stage, at first step LBP operator is
applied to all rows (columns) of a defect free fabric sample, pixel by pixel, and the reference
feature vector is computed. Then this image is divided into windows and LBP operator is
applied to each row (column) of these windows. Based on comparison with the reference
feature vector a suitable threshold for defect free windows is found. In the detection stage, a
test image is divided into windows and using the threshold, defective windows can be
detected. The proposed method is simple and gray scale invariant. Because of its simplicity,
online implementation is possible as well.
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Defect Detection in Patterned Fabrics Using Modified Local Binary Patterns .pdf
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