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Description: In this paper, we describe two single input threshold
gate (TLG) designs, which are functionally equivalent to differential
flipflops. We present a detailed comparison of TLGs
with two well established D-flipflop designs. The comparisons
are done in both 65nm and 28nm commercial processes. We
compare total delay, which is defined as the sum of setup delay
and clock to output delay.We also show a comparison of tolerance
against noise and process variation between the different designs.
The two proposed designs are found to be as robust as an
existing D-flipflop both commercial standard cell libraries.
Meanwhile, they are 33 and 25 faster in 65nm post-layout
and 25 and 22 faster in 28nm post-layout compared to a
commercial D-flipflop.
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