Description: this test procedure is against TMS320LF2407 EVM performance testing and development of the design. Procedures will be running sequence of data RAM space, the code space, on-chip serial asynchronous communication, ADC-DAC detection, and two-way digital I/O and general purpose I/O and Evaluation LED, the board side-by-side manual switches were tested. The test results are correct or incorrect information display.
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