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Description: 高性能、低功耗的8 位AVR® 微处理器
• 先进的RISC 结构,JTAG 接口( 与IEEE 1149.1 标准兼容)-high performance, low power AVR 8
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Size: 2806052 |
Author: 丫倪儿 |
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Description: poj 1149 pigs 最大流的例题 还要写什么-poj 1,149 pigs maximum flow of excellence he wrote.
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Size: 986 |
Author: 王一然 |
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Description: 北京大学poj上训练题目,邮寄到经典题目
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Size: 14306 |
Author: li |
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Description: jtag协议,IEE1149.1协议文档。
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Size: 328506 |
Author: 长洪 |
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Description: JTAG Tools is a software package which enables working with JTAG-aware
(IEEE 1149.1) hardware devices (parts) and boards through JTAG adapter.
Platform: |
Size: 466107 |
Author: pavel |
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Description: IEEE 1149标准 JTAG,好东东,藏了多年了,-JTAG IEEE 1149 standard, good Dongdong, possession of years, huh
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Size: 1091584 |
Author: |
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Description: 高性能、低功耗的8 位AVR® 微处理器
• 先进的RISC 结构,JTAG 接口( 与IEEE 1149.1 标准兼容)-high performance, low power AVR 8
Platform: |
Size: 2805760 |
Author: 丫倪儿 |
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Description: poj 1149 pigs 最大流的例题 还要写什么-poj 1,149 pigs maximum flow of excellence he wrote.
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Size: 1024 |
Author: 王一然 |
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Description: IEEE 1149 标准 JTAG 原文 -The original IEEE 1149 standard JTAG
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Size: 1080320 |
Author: Tristan |
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Description: OPEN-JTAG ARM JTAG 測試原理
1 前言
本篇報告主要介紹ARM JTAG測試的基本原理。基本的內容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介紹,在此基礎上,結合ARM7TDMI詳細介紹了的JTAG測試原理。
2 IEEE Standard 1149.1 - Test Access Port and Boundary-Scan Architecture
從IEEE的JTAG測試標準開始,JTAG是JOINT TEST ACTION GROUP的簡稱。IEEE 1149.1標準最初是由JTAG這個組織提出,最終由IEEE批准並且標準化,所以,IEEE 1149.1這個標準一般也俗稱JTAG測試標準。
接下來介紹TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的基本架構。
-OPEN-JTAG ARM JTAG Test Principle 1 Introduction This report introduces the ARM JTAG test the basic principles. Basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction On this basis, the combination of ARM7TDMI detailed introduction of the JTAG test principle. 2 IEEE Standard 1149.1- Test Access Port and Boundary-Scan Architecture from the IEEE standard JTAG test began, JTAG is the JOINT TEST ACTION GROUP abbreviation. IEEE 1149.1 standard was originally proposed by JTAG this organization, and ultimately approved by the IEEE and standardization, therefore, IEEE 1149.1 standard generally known as the JTAG test standard. Introduce the next TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE basic structure.
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Size: 286720 |
Author: jakenzhang |
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Description: jtag协议,IEE1149.1协议文档。-JTAG protocol, IEE1149.1 agreement document.
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Size: 328704 |
Author: 长洪 |
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Description: JTAG Tools is a software package which enables working with JTAG-aware
(IEEE 1149.1) hardware devices (parts) and boards through JTAG adapter.
Platform: |
Size: 465920 |
Author: pavel |
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Description: 理财管理系统 对财务进行管理 能使财务不丢失-very good
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Size: 8741888 |
Author: limingzhe |
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Description: JTAG Tools is a software package which enables working with JTAG-aware
(IEEE 1149.1) hardware devices (parts) and boards through JTAG adapter
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Size: 304128 |
Author: Jose |
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Description: Norm 1149.1 implemented in VHDL language.
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Size: 238592 |
Author: jose |
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Description: IEEE std 1149.1-2001总线相关资料,是英文的。-1149.1 bus-related information is in English.
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Size: 1080320 |
Author: sunjianing |
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Description: JTAG(Joint Test Action Group,联合测试行动小组)是1985年制定的检测PCB和IC芯片的一个标准,1990年被修改后成为IEEE的一个标准,即IEEE1149.1-1990。IEEE 1149.1标准就是由JTAG这个组织最初提出的,最终由IEEE批准并且标准化的。所以,这个IEEE 1149.1这个标准一般也俗称JTAG调试标准。
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Size: 187392 |
Author: cdm |
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Description: VC++ 实现JTAG(1149.1)的烧写,JTAG测试单片机(arm,arv)源代码。-vc++ releasize jtag 1149.1 programmer test
microchip(arm, avr )and so on.
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Size: 278528 |
Author: icecream |
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Description: 1.1 Compliant with IEEE 1149.1
1.2 Support mandatory BYPASS, SAMPLE/PRELOAD, EXTEST instructions
1.3 Support user register connection beetween TDI-TDO
1.4 Boundary-scan register consist of cell type BC_1
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Size: 2048 |
Author: scnn86 |
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Description: 这篇文章主要介绍 ARM JTAG 调试的基本原理。 基本的内容包括了 TAP (TEST ACCESS PORT) 和 BOUNDARY-SCAN ARCHITECTURE 的介绍, 在此基础上, 结合 ARM7TDMI 详细介绍了的 JTAG 调试原理。(OPEN-JTAG Development Group.)
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Size: 462848 |
Author: ZhouGuofei
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