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Description: 这篇文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍，在此基础上，结合ARM7TDMI详细介绍了的JTAG调试原理。-This article introduces the ARM JTAG debugging basic tenets. The basic elements include the TAP (TEST PORT ACCESS) and BOUNDARY- SCAN ARCHITECTURE presentation on this basis, the combined ARM7TDMI details of the principles of JTAG debugging.
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Size: 452608 |
Author: 李易 |
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Description: 边界扫描软件，可根据BSDL以及连形状检测板上电路连接，可在指定引脚上输出方波。-Boundary Scan software, and even under the BSDL shape detection circuit boards, at the designated pin on the output pulse.
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Size: 1473536 |
Author: baoli |
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Description: 介绍一个芯片边界扫描测试的原理及应用详细文档-Introduced a chip boundary scan test principle and application of detailed documentation
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Size: 344064 |
Author: feixu |
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Description: JTAG是一种所谓的边界扫描技术，即IEEE1149.1。本文将对JTAG的工作原理及打印口工作原理作简要介绍-JTAG is a so-called boundary-scan techniques, namely the IEEE1149.1. In this paper the working principle of JTAG LPT brief working principle
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Size: 34816 |
Author: Tristan |
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Description: AT91SAM7S256_TQ64_bsd.zip Boundary-Scan Description file (BSD) for the AT91SAM7S256 in LQFP 64 package.
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Size: 3072 |
Author: wangwang |
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Description: 这篇文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍，在此基础上，结合ARM7TDMI详细介绍了的JTAG调试原理。
这篇文章主要是总结了前段时间的一些心得体会，希望对想了解ARM JTAG调试的网友们有所帮助。我个人对ARM JTAG的理解还不是很透彻，在文章中，难免会有偏失和不准确的地方，希望精通JTAG调试原理的大侠们不要拍砖，有什么问题提出来，我一定尽力纠正。同时也欢迎对ARM JTAG调试感兴趣的朋友们一起交流学习。-This article introduces the ARM JTAG debug the basic principles. Basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction On this basis, the combination of ARM7TDMI detailed principle of the JTAG debugger. This article mainly summarizes some previous experiences, in the hope that would like to know ARM JTAG debug netizens help. I personally do not understand the ARM JTAG is very thorough, in his article, it is inevitable there will be ignored and inaccurate, hoping the master principle of JTAG debug拍砖heroes will not have any issue, I will certainly make every effort to rectify . At the same time, also welcomed the ARM JTAG debug friends interested in the exchange of learning.
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Size: 453632 |
Author: 郭丰平 |
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Description: 应用于dsp2810的边界扫描测试中，是2810的边界扫描说明文档-Dsp2810 applies to the boundary-scan test, is the 2810 documentation of the boundary-scan
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Size: 5120 |
Author: www |
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Description: OPEN-JTAG ARM JTAG 測試原理
1 前言
本篇報告主要介紹ARM JTAG測試的基本原理。基本的內容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介紹，在此基礎上，結合ARM7TDMI詳細介紹了的JTAG測試原理。
2 IEEE Standard 1149.1 - Test Access Port and Boundary-Scan Architecture
從IEEE的JTAG測試標準開始，JTAG是JOINT TEST ACTION GROUP的簡稱。IEEE 1149.1標準最初是由JTAG這個組織提出，最終由IEEE批准並且標準化，所以，IEEE 1149.1這個標準一般也俗稱JTAG測試標準。
接下來介紹TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的基本架構。
-OPEN-JTAG ARM JTAG Test Principle 1 Introduction This report introduces the ARM JTAG test the basic principles. Basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction On this basis, the combination of ARM7TDMI detailed introduction of the JTAG test principle. 2 IEEE Standard 1149.1- Test Access Port and Boundary-Scan Architecture from the IEEE standard JTAG test began, JTAG is the JOINT TEST ACTION GROUP abbreviation. IEEE 1149.1 standard was originally proposed by JTAG this organization, and ultimately approved by the IEEE and standardization, therefore, IEEE 1149.1 standard generally known as the JTAG test standard. Introduce the next TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE basic structure.
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Size: 286720 |
Author: jakenzhang |
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Description: JTAG 边界扫描技术的研究,可以通过硬件结合软件来给手机编程，希望大家用得上！-JTAG boundary-scan technology can be combined with software to hardware to cell phone programming, hope that useful!
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Size: 34816 |
Author: huang |
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Description: 边界扫描调试的技巧分享 Post By：2008-12-18 13:55:21
我咨询过的用户大概都会提出以下三个问题：
1. 什么情况又会造成边界扫描测试不稳定？
2. 怎样调试边界扫描？
3. 安捷伦的调试工具怎样用呢？
那么，今天的课题就来为各位解答这三个问题。-Boundary-scan testing techniques to share Post By :2008-12-18 13:55:21 I consulted the user probably will make the following three questions: 1. What the situation would cause instability in boundary-scan test? 2. How boundary-scan debug? 3. Agilent how the debugging tools for? Well, today' s topic for you to answer three questions.
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Size: 4096 |
Author: weikun |
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Description: JTAG边界扫描的原理和教程
非常详细地介绍了边界扫描和寄存器设置的原理-JTAG boundary-scan principle and tutorials are very detailed description of the boundary-scan register and set up the principle of
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Size: 1574912 |
Author: Hong Jie |
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Description: 边界扫描技术的讲解及其使用方法，是一本英文版的电子书。-Boundary-scan technology, explaining its use, is an English version of the book.
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Size: 5373952 |
Author: 宁聚 |
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Description: Boundary scan program tester in labview language.
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Size: 2415616 |
Author: jose |
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Description: jtag边界扫描的经典书籍，内容很详细。是pcb设计人员、芯片设计人员、dft人员必修的内容之一。-Jtag Boundary-Scan Test- A Practical Approach
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Size: 5372928 |
Author: david |
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Description: apex20k boundary scan program
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Size: 15360 |
Author: henry |
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Description: 这篇文章主要介绍 ARM JTAG调试的基本原理。基本的内容包括了 TAP (TEST ACCESS
PORT) 和 BOUNDARY-SCAN ARCHITECTURE 的介绍，在此基础上，结合 ARM7TDMI 详细
介绍了的 JTAG 调试原理。-This article introduces the basic principles of ARM JTAG debug. Basic elements include TAP (TEST ACCESS PORT) and BOUNDARY-SCAN ARCHITECTURE introduction, on this basis, combined with ARM7TDMI described in detail the principles of JTAG debugging.
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Size: 462848 |
Author: huitng |
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Description: 基于SOPC的边界扫描测试控制器IP核设计SOPC-based boundary scan test controller IP core design-SOPC-based boundary scan test controller IP core design
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Size: 458752 |
Author: zaizai112 |
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Description: ebook on Jtag and boundary scan
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Size: 1003520 |
Author: Sandeep |
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Description: 边界扫描技术相关资料，官方说明，含各个模块的介绍。很有参考价值。-Boundary-Scan Architecture
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Size: 50176 |
Author: mojhui |
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Description: 通过JTAG接口实现在系统编程， 通过边界扫描方式，对于外部的NOR FLASH效果明显(Through the JTAG interface implementation in the system programming, through the boundary scan mode, the external NOR FLASH effect is obvious)
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Size: 237568 |
Author: georgehzf |
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